Micromachines
MCHB-DETR: An Efficient and Lightweight Inspection Framework for Ink Jet Printing Defects in Semiconductor Packaging.
Yibin Chen, Jiayi He, Zhuohao Shi, Yisong Pan, Weicheng Ou
Published: 202610.3390/mi17010109
Abstract
In semiconductor packaging and microelectronic manufacturing, inkjet printing technology is widely employed in critical processes such as conductive line fabrication and encapsulant dot deposition. However, dynamic printing defects, such as missing d…
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