Micromachines
Tin-Lead Liquid Metal Alloy Source for Focused Ion Beams.
Bryan Flores, Shei Sia Su, Coleman Cariker, Ricardo A Dacosta, Aaron M Katzenmeyer, Alex A Belianinov, Michael Titze
Published: 202610.3390/mi17010076
Abstract
Focused Ion Beam (FIB) systems are increasingly utilized in nanotechnology for nanostructuring, surface modification, doping, and rapid prototyping. Recently, their potential for quantum applications has been explored, leveraging FIB's direct-write c…
Preview only. Read the full abstract at the source