BMC plant biology
Genetic basis of flag leaf thickness and its contribution to yield in wheat (Triticum aestivum L.).
Yanan Niu, Qixiang Huang, Huankun Yang, Tianxiao Chen, Chenchen Zhao, Fei Zheng, Chunji Liu, Haiyan Hu, Guoping Zhang, Lingzhen Ye, Meixue Zhou
Published: 202510.1186/s12870-025-08014-3
Abstract
BACKGROUND: Previous studies on leaf morphological traits are predominantly focused on flag leaf length (FLL), width (FLW), and area (FLA), which are known to affect light interception. However, limited research has addressed on flag leaf thickness (…
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