Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
A Comprehensive Analysis of Combined AFM/SEM Systems for In-Situ Nanoscale Characterizations and Multiparametric Correlative Microscopy.
Prabhu Prasad Swain, Marcos Penedo, Georg Ernest Fantner
Published: 202510.1093/mam/ozaf110
Abstract
Since their discovery, scanning probe microscopy (SPM) and scanning electron microscopy (SEM) techniques have been extensively employed across diverse research fields for nanoscale characterization and analysis. While their ex-situ combination has be…
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