Nanotechnology
Efficient total ionizing dose-aware standard cell characterization methodology for path-level timing performance in nanoscale digital circuit applications.
Lomash Chandra Acharya, Khoirom Johnson Singh, Neha Gupta, Mahipal Dargupally, Neeraj Mishra, Arvind Kumar Sharma, Abhishek Acharya, Venkatraman Ramakrishnan, Ajoy Mandal, Sudeb Dasgupta, Anand Bulusu
Published: 202610.1088/1361-6528/ae2a3c
Abstract
As CMOS technology scales into the nanoscale regime, ensuring the reliability of digital circuits in radiation-rich environments has become a critical challenge. Standard cell libraries, which are foundational to digital design, are typically charact…
Preview only. Read the full abstract at the source