Nanoscale
High-precision AFM cutting of graphene via improved electrode-free local anodic oxidation for electronic band engineering.
Zhenghan Wu, Xianliang Zhou, Kunqi Xu, Zhichun Zhang, Yufeng Xie, Kenji Watanabe, Takashi Taniguchi, Zhiwen Shi
Published: 202510.1039/d5nr03204k
Abstract
Atomic force microscopy (AFM) cutting of graphene via electrode-free localized anodic oxidation (EFLAO), with great convenience and flexible pattern design, has been widely used in various experimental investigations of graphene and its nanostructure…
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