Scientific reports
Influence of metal-semiconductor interface treatments and absorber structure on the performance and reliability of uni-traveling-carrier photodiodes (UTC-PDs).
Soo Cheol Kang, Jin Chul Cho, Eui Su Lee, Dong Woo Park
Published: 202610.1038/s41598-025-34935-y
Abstract
The effects of absorber structure-controlled by adjusting the thickness ratio of doped and undoped InGaAs layers-and metal-semiconductor interface treatment methods were investigated in waveguide-type UTC-PDs. Ultraviolet-ozone (UVO) and ammonia solu…
Preview only. Read the full abstract at the source