ACS nano
Characterization of WSe2 Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses.
Tianbi Zhang, Jakub Holzer, Tomáš Vystavěl, Miroslav Kolíbal, Estacio Paiva de Araujo, Chris Stephens, T Ben Britton
Published: 202510.1021/acsnano.5c10753
Abstract
The study of thin films and two-dimensional (2D) materials, including transition metal dichalcogenides such as WSe2 offers opportunities to leverage their properties in advanced sensors, quantum technologies, and devices to optimize functional perfor…
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