Langmuir : the ACS journal of surfaces and colloids
Characterization of Interface Characteristics of Hexagonal Boron Nitride with Different Thicknesses Using Scanning Microwave Microscopy.
Jun Xing, Huan Fei Wen, Tao Pei, Qi Wang, Qiang Zhu, Enbo Xing, Xin Li, Zhonghao Li, Hao Guo, Zongmin Ma, Jun Tang, Jun Liu
Published: 202510.1021/acs.langmuir.5c03578
Abstract
Hexagonal boron nitride (h-BN) holds significant application value in two-dimensional electronic devices due to its excellent dielectric properties. This study characterized the microwave response characteristics of h-BN with different thicknesses an…
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