The journal of physical chemistry letters
Re-Evaluating the Impact of Stacked Electrodes in Metal-Semiconductor Contacts Based on a-IGO Thin-Film Transistors.
Boxi Ye, Han He, Dinghao Ma, Zijun Chen, Hao Huang, Guanshun Liu, Haowei Li, Shiwei Sun, Liting Liu, Xuming Zou, Xinpeng Wang, Bingsuo Zou
Published: 202510.1021/acs.jpclett.5c03282
Abstract
Low-resistance ohmic contact is a critical issue that must be addressed for the practical application of oxide thin-film transistors (TFTs). In stacked electrodes, it was conventionally believed that the bottom metal layer in direct contact with the…
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