Ultramicroscopy
STEM-EELS study of beam damage in polymers and extra-terrestrial organic matter using direct electron detectors.
Sylvain Laforet, Corentin Le Guillou, Adrien Teurtrie, Maya Marinova, Francisco de la Peña, Anne-Marie Blanchenet, Sylvain Bernard, Hugues Leroux
Published: 202610.1016/j.ultramic.2026.114309
Abstract
Characterizing organic compounds using STEM-EELS at high spatial resolution is crucial in materials science and geosciences, especially for organics intricately mixed with minerals at the nanoscale, as is the case in carbonaceous meteorites. However,…
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