Ultramicroscopy
Fast tapping mode atomic force microscopy based on fuzzy PI controller.
Lijia Ji, Renjie Gui, Jinbo Chen, Xuhui Zhang, Gengliang Chen
Published: 202610.1016/j.ultramic.2025.114281
Abstract
Atomic Force Microscopy (AFM), as a scanning probe microscopy technique, has been extensively utilized for nanoscale structural characterization, mechanical property quantification, and in-situ electromagnetic field measurements with high spatial res…
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