Ultramicroscopy
Secondary electron topographical contrast formation in scanning transmission electron microscopy.
Evgenii Vlasov, Wouter Heyvaert, Tom Stoops, Sandra Van Aert, Johan Verbeeck, Sara Bals
Published: 202610.1016/j.ultramic.2025.114278
Abstract
Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo-3D topographic information. However, contrast interpretation of such…
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