Micron (Oxford, England : 1993)
Development and validation of an interface for automated image acquisition during high-temperature environmental scanning electron microscopy experiments.
J Lautru, R Podor
Published: 202610.1016/j.micron.2025.103980
Abstract
An interface that enables automatic image acquisition during high-temperature experiments in an environmental SEM is developed. It is optimized to work on multiple regions of interest at multiple magnifications, performing image focusing (focus and a…
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