Micron (Oxford, England : 1993)
Molecular dynamic simulation of multi-frequency electrostatic force microscopy.
Quan Yuan, Jianqiang Qian, Yingzi Li, Minghao Wang, Rui Lin, Yifan Hu, Duo Feng, Peng Cheng, Yanan Chen, Haowei Sun
Published: 202610.1016/j.micron.2025.103979
Abstract
Multifrequency electrostatic force microscopy (MF-EFM) is a critical tool for the electrical characterization of nanomaterial surfaces, and the quality is closely related to parameters. Molecular simulations have successfully explained the motion pro…
Preview only. Read the full abstract at the source