Micron (Oxford, England : 1993)
Extracting TEM lamellae from micro/nano particles through a thin film embedding strengthened FIB approach.
Bo Deng, Li Lei, Lei Wang, Shanjian Li, Ke Xu, Jing Zhang, Fuxue Yan, Caiyin You
Published: 202610.1016/j.micron.2025.103943
Abstract
A cross-sectional lamella in thickness around 20 ∼ 100 nm is essential for (S)TEM characterizations of micro/nano particles with compositional gradients or structural inhomogeneity including core shell, surface doped and coated structures, or those w…
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