Small methods
Adverse Effects of Stacking Mismatch Boundaries on GaN Optoelectronic Properties.
Jiaxing Wang, Jingyang Zhang, Qinchi Yue, Rui Zhang, Changhao Wang, Xianlin Qu, Zhiyang Xu, Ruzhi Wang, Kun Zheng
Published: 202510.1002/smtd.202502316
Abstract
Understanding and establishing the relationship between the defect and macroscopic characteristics is crucial for materials. It is great challenge for linking atomic-scale defect structures to device performance owing to the difficulty in isolating s…
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